Rapid detection method for microbial spoilage using FT-IR and machine learning

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dc.contributor.author Rowland, Jeremy John
dc.contributor.author Broadhurst, David I.
dc.contributor.author Ellis, David I.
dc.contributor.author Goodacre, Royston
dc.contributor.editor van Amerongen, A.
dc.contributor.editor Barug, D.
dc.contributor.editor Lauwaars, M.
dc.date.accessioned 2006-04-24T14:41:58Z
dc.date.available 2006-04-24T14:41:58Z
dc.date.issued 2005
dc.identifier.citation Rowland , J J , Broadhurst , D I , Ellis , D I & Goodacre , R 2005 , ' Rapid detection method for microbial spoilage using FT-IR and machine learning ' . in A van Amerongen , D Barug & M Lauwaars (eds) , Rapid Methods for Food and Feed Quality Determination . Wageningen Academic Publishers , pp. 73-81 . en
dc.identifier.isbn 978-90-76998-93-0
dc.identifier.other PURE: 67930
dc.identifier.other dspace: 2160/123
dc.identifier.uri http://hdl.handle.net/2160/123
dc.description Ellis, D.I., Broadhurst, D., Rowland, J.J. and Goodacre, R. (2005) Rapid detection method for microbial spoilage using FT-IR and machine learning. In: Rapid Methods for Food and Feed Quality Determination, (Eds) van Amerongen, A., Barug, D and Lauwaars, M., Wageningen Academic Publishers, Wageningen, Netherlands, in press. en
dc.language.iso eng
dc.publisher Wageningen Academic Publishers
dc.relation.ispartof Rapid Methods for Food and Feed Quality Determination en
dc.title Rapid detection method for microbial spoilage using FT-IR and machine learning en
dc.type Text en
dc.type.publicationtype Book chapter en
dc.contributor.institution Department of Computer Science en
dc.contributor.institution Bioinformatics and Computational Biology Group en


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