Internal structure of copper(II)-phthalocyanine thin films on SiO2/Si substrates investigated by grazing incidence x-ray reflectometry

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dc.contributor.author Jones, D. G.
dc.contributor.author Brieva, A. C.
dc.contributor.author Jenkins, Tudor
dc.contributor.author Evans, D. A.
dc.date.accessioned 2008-12-09T09:33:38Z
dc.date.available 2008-12-09T09:33:38Z
dc.date.issued 2006-04
dc.identifier.citation Jones , D G , Brieva , A C , Jenkins , T & Evans , D A 2006 , ' Internal structure of copper(II)-phthalocyanine thin films on SiO2/Si substrates investigated by grazing incidence x-ray reflectometry ' Journal of Applied Physics , vol 99 , no. 7 , pp. 73504 . en
dc.identifier.issn 0021-8979
dc.identifier.other PURE: 89298
dc.identifier.other dspace: 2160/1462
dc.identifier.uri http://hdl.handle.net/2160/1462
dc.description Jenkins, Tudor; Brieva, A.C.; Jones, D.G.; Evans, D.A., (2006) 'Internal structure of copper(II)-phthalocyanine thin films on SiO2/Si substrates investigated by grazing incidence x-ray reflectometry', Journal of Applied Physics 99 pp.73504 RAE2008 en
dc.description.abstract The internal structure of copper(II)-phthalocyanine (CuPc) thin films grown on SiO2/Si by organic molecular beam deposition has been studied by grazing incidence x-ray reflectometry (GIXR) and atomic force microscopy. The electronic density profile is consistent with a structure formed by successive monolayers of molecules in the form with the b axis lying in the substrate surface plane. The authors present an electronic density profile model of CuPc films grown on SiO2/Si. The excellent agreement between the model and experimental data allows postdeposition monitoring of the internal structure of the CuPc films with the nondestructive GIXR technique, providing a tool for accurate control of CuPc growth on silicon-based substrates. In addition, since the experiments have been carried out ex situ, they show that these structures can endure ambient conditions. en
dc.format.extent 73504 en
dc.language.iso eng
dc.relation.ispartof Journal of Applied Physics en
dc.title Internal structure of copper(II)-phthalocyanine thin films on SiO2/Si substrates investigated by grazing incidence x-ray reflectometry en
dc.type Text en
dc.type.publicationtype Article (Journal) en
dc.identifier.doi http://dx.doi.org/10.1063/1.2180399
dc.contributor.institution Institute of Biological, Environmental and Rural Sciences en
dc.contributor.institution Institute of Mathematics & Physics (ADT) en
dc.contributor.institution Mathematics and Physics en
dc.description.status Peer reviewed en


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