Mode III crack propagation in a bimaterial plane driven by a channel of small line defects

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dc.contributor.author Piccolroaz, Andrea
dc.contributor.author Movchan, Natasha
dc.contributor.author Movchan, Alexander
dc.contributor.author Mishuris, Gennady
dc.date.accessioned 2012-10-31T11:11:12Z
dc.date.available 2012-10-31T11:11:12Z
dc.date.issued 2012-10-31
dc.identifier.citation Piccolroaz , A , Movchan , N , Movchan , A & Mishuris , G 2012 , ' Mode III crack propagation in a bimaterial plane driven by a channel of small line defects ' Computational Materials Science , vol 64 , pp. 239-243 . , 10.1016/j.commatsci.2012.02.037 en
dc.identifier.other PURE: 175910
dc.identifier.other dspace: 2160/7894
dc.identifier.uri http://hdl.handle.net/2160/7894
dc.description Piccolroaz, A., Mishuris, G., Movchan, A., Movchan, N. (2012). Mode III crack propagation in a bimaterial plane driven by a channel of small line defects. Computational Materials Science, 64, pp. 239-243. Proceedings of the 21st International Workshop on Computational Mechanics of Materials (IWCMM 21) en
dc.description.abstract We consider the quasi-static propagation of a Mode III crack along the interface in a bimaterial plane containing a finite array of small line defects (microcracks and rigid line inclusions). The microdefects are arranged to form a channel around the interface that can facilitate (or prevent) the crack propagation. The two dissimilar elastic materials are assumed to be weakly bonded, so that there is no kinking of the main crack from the straight path. On the basis of asymptotic formulae obtained by the authors, the propagation is analysed as a perturbation problem and the incremental crack advance is analytically derived at each position of the crack tip along the interface relative to the position of the defects. Numerical examples are provided showing potential applications of the proposed approach in the analysis of failure of composite materials. Extension to the case of infinite number of defects is discussed. en
dc.format.extent 5 en
dc.language.iso eng
dc.relation.ispartof Computational Materials Science en
dc.title Mode III crack propagation in a bimaterial plane driven by a channel of small line defects en
dc.type Text en
dc.type.publicationtype Article (Journal) en
dc.identifier.doi http://dx.doi.org/10.1016/j.commatsci.2012.02.037
dc.contributor.institution Institute of Mathematics & Physics (ADT) en
dc.contributor.institution Mathematical Modelling of Structures, Solids and Fluids en
dc.description.status Peer reviewed en


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